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This is Registration button. Please submit your paper to E-mail: jomm_iwaps@ime.ac.cn

Call for Papers

Abstract Deadline: June 30th 2018      Abstract Acceptance Notification: July 15th 2018

Manuscript Deadline: September 30th 2018

Email: jomm_iwaps@ime.ac.cn


Scope of IWAPS Paper

IWAPS is devoted to publishing research on the cutting-edge microelectronic manufacturing technology. The scope of the conference covers studies of advanced semiconductor manufacturing sciences and technologies from early stage theories and experiments to industrial high volume manufacturing applications. The perspective scope includes, but is not limited to the following areas:  

I:Nanolithography and Nanopatterning

II:Pattern Transfer


IV:Nanometrology, Inspection and Testing

V:Advanced Processing and Nanofabrication

VI:Advanced Nanoelectronics, Photonic, Sensing, Energy Harvesting, and Fluidic Devices

VII:Advanced Fabrication and Characterization for Heterogeneous Micro and Nano Systems  

Full length manuscripts of accepted papers will be considered for publication in an international journal.  


Abstract Instructions

The abstract must clearly describe the nature, scope, content, organization, key points and significance of the proposed paper.  

The ABSTRACT must include paper title, key words, author name, affiliation and full contact information (email and address). The Word of Abstract limit is up to 500 words. Introductory paragraph describing the intended content of your conference is a huge plus to your papers. Graphs are highly encouraged in the submitted abstract.  

Abstracts submitted after the published deadline will be considered on a case-by-case basis.  

Presentation Instructions

We hope the selected paper author could attend IWAPS 2018 and give a 15 minutes technical overview presentation about your paper. Speakers are responsible for providing a PPT in advance to be uploaded for presentation at the conference. The PPT Due is October 15th 2018. Please send PPT to jomm_iwaps@ime.ac.cn before the due date. 


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